The Non-Destructive Correlated Double Sampling (NDCDS) is enabled by the ability to transfer signal charge continuously between two MIGs. Below is a video which demonstrates how charge can be transferred in a basic double MIG pixel. Both simulation and measurement results are shown. The measurement is taken from a single pixel test structure which don’t include any additional read-out circuitry.
Note that the y-axis in the measurement data is voltage and the x-axis is time. The higher the measurement signal is the more there are electrons in the corresponding MIG. If you have any questions about the video please feel free to post a comment.